Journal of Statistical Theory and Applications

Volume 14, Issue 3, September 2015, Pages 281 - 288

Approach of Reliability Approximation with Extent of Error for a Resistor under Weibull Setup

Authors
Sadananda Nayak, Dilip Roy
Corresponding Author
Sadananda Nayak
Received 28 September 2014, Accepted 3 March 2015, Available Online 1 September 2015.
DOI
10.2991/jsta.2015.14.3.5How to use a DOI?
Keywords
Stress-Strength Model, System Reliability, Weibull distribution, Reliability bound, Reliability approximation, Extent of error.
Abstract

Analytical determination of reliability of a complex system is item dependent and setup dependent and a very difficult task. In this paper we propose reliability approximation based on reliability bounds for one such engineering item - a Resistor with independent components having the Weibull distribution. Earlier approach for reliability approximation was discretization. We provide a different approach for reliability approximation so that one not only gets a clear idea about the extent of error but also can adjust reliability in terms of distributional parameters. This reliability approximation having the Weibull distribution can be of practical use and importance as reliability approximation is developed in terms of distributional parameters.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Journal
Journal of Statistical Theory and Applications
Volume-Issue
14 - 3
Pages
281 - 288
Publication Date
2015/09/01
ISSN (Online)
2214-1766
ISSN (Print)
1538-7887
DOI
10.2991/jsta.2015.14.3.5How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - JOUR
AU  - Sadananda Nayak
AU  - Dilip Roy
PY  - 2015
DA  - 2015/09/01
TI  - Approach of Reliability Approximation with Extent of Error for a Resistor under Weibull Setup
JO  - Journal of Statistical Theory and Applications
SP  - 281
EP  - 288
VL  - 14
IS  - 3
SN  - 2214-1766
UR  - https://doi.org/10.2991/jsta.2015.14.3.5
DO  - 10.2991/jsta.2015.14.3.5
ID  - Nayak2015
ER  -