Proceedings of the 5th International Conference on Advanced Design and Manufacturing Engineering

Extracting Faint Signals Behind Bright Sources From CLASH Imaging Using Fourier Analysis

Authors
Yao Li, Ding-Peng Li, Feng-Jie Lei, Feng-Shan Liu
Corresponding Author
Yao Li
Available Online October 2015.
DOI
10.2991/icadme-15.2015.105How to use a DOI?
Keywords
CLASH, Image processing, Intra-cluster light, Fourier expansion
Abstract

With the combination of deep Hubble Space Telescope Imaging and magnification due to gravitational lensing, the CLASH program offers an unprecedented opportunity to search for supernovae at high redshifts and detect some of the most distant galaxies as well. Unfortunately, the cluster field suffers from a high abundance of bright foreground sources and high background due to intra-cluster light. To overcome these difficulties, we have developed a method of modeling and subtracting bright foreground light in the clusters using Fourier analysis. In this paper, I will present preliminary results based our method, which significantly increases the effective depth of the images, and efficiently characterizes distant background signals in the clusters.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 5th International Conference on Advanced Design and Manufacturing Engineering
Series
Advances in Engineering Research
Publication Date
October 2015
ISBN
10.2991/icadme-15.2015.105
ISSN
2352-5401
DOI
10.2991/icadme-15.2015.105How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yao Li
AU  - Ding-Peng Li
AU  - Feng-Jie Lei
AU  - Feng-Shan Liu
PY  - 2015/10
DA  - 2015/10
TI  - Extracting Faint Signals Behind Bright Sources From CLASH Imaging Using Fourier Analysis
BT  - Proceedings of the 5th International Conference on Advanced Design and Manufacturing Engineering
PB  - Atlantis Press
SP  - 523
EP  - 527
SN  - 2352-5401
UR  - https://doi.org/10.2991/icadme-15.2015.105
DO  - 10.2991/icadme-15.2015.105
ID  - Li2015/10
ER  -