Proceedings of the 2015 International Conference on Mechatronics, Electronic, Industrial and Control Engineering
This volume contains some selected papers from the International Conference on Mechatronics, Electronic, Industrial and Control Engineering (MEIC 2015) which is to be held in Shenyang, China, on April 24-26, 2015. The conference aims to provide a high-level international forum for engineers and scientists to present their new advances and research results.
This volume covers all aspects of Mechatronics, Electronic, Industrial and Control Engineering. All of the papers were reviewed by more than three expert referees in their relevancy to the conference. The editors hope that this volume will provide the reader a broad overview of the latest Mechatronics, Electronic, Industrial and Control Engineering processing, and that it will be a valuable reference source for further research.
The editors would like to express their sincere appreciations and thanks to all the members of the MEIC 2015 Conference Organizing Committee and the Technical Program Committee for their tremendous efforts. They are indebted to the referees for their constructive comments on the papers. Without their dedication, it was impossible to have a successful MEIC 2015 and a high quality volume of the conference proceedings. Thanks are also given to Atlantis Press for producing this volume. Finally, the editors would like to thank all the authors for their contributions to this valuable volume.
Liu Chang
Chang Guiran
Luo Zhen
This volume covers all aspects of Mechatronics, Electronic, Industrial and Control Engineering. All of the papers were reviewed by more than three expert referees in their relevancy to the conference. The editors hope that this volume will provide the reader a broad overview of the latest Mechatronics, Electronic, Industrial and Control Engineering processing, and that it will be a valuable reference source for further research.
The editors would like to express their sincere appreciations and thanks to all the members of the MEIC 2015 Conference Organizing Committee and the Technical Program Committee for their tremendous efforts. They are indebted to the referees for their constructive comments on the papers. Without their dedication, it was impossible to have a successful MEIC 2015 and a high quality volume of the conference proceedings. Thanks are also given to Atlantis Press for producing this volume. Finally, the editors would like to thank all the authors for their contributions to this valuable volume.
Liu Chang
Chang Guiran
Luo Zhen