Proceedings of the 2015 4th International Conference on Computer, Mechatronics, Control and Electronic Engineering

Research on Pitting Behavior of DH32 Steel in Presence of Thiosulfate and Chloride Ions

Authors
Li Zhang, Xianpeng OuYang, YuanYuan Shen, Xiafei Zhang, XuCheng Dong
Corresponding Author
Li Zhang
Available Online November 2015.
DOI
10.2991/iccmcee-15.2015.124How to use a DOI?
Keywords
Pitting; DH32 Steel; Thiosulfate;Potentiodynamic Polarization
Abstract

The pitting behavior of DH32 steel was studied by using the potentiodynamic polarization method. The results showed that the passivation zone narrowed as the concentrations of chloride ions and thiosulfate ions(S2O32-) increased. At high S2O32- ions concentrations, there was a more potential shift to the positive. At high chloride concentrations, i.e. 10% mass NaCl solution, it is noticeable that the pitting corrosion rates had a reverse nature with the increase in concentration of S2O32- ions. These findings also concur with the metallographic examination of the specimens after polarization tests.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 4th International Conference on Computer, Mechatronics, Control and Electronic Engineering
Series
Advances in Engineering Research
Publication Date
November 2015
ISBN
10.2991/iccmcee-15.2015.124
ISSN
2352-5401
DOI
10.2991/iccmcee-15.2015.124How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Li Zhang
AU  - Xianpeng OuYang
AU  - YuanYuan Shen
AU  - Xiafei Zhang
AU  - XuCheng Dong
PY  - 2015/11
DA  - 2015/11
TI  - Research on Pitting Behavior of DH32 Steel in Presence of Thiosulfate and Chloride Ions
BT  - Proceedings of the 2015 4th International Conference on Computer, Mechatronics, Control and Electronic Engineering
PB  - Atlantis Press
SP  - 689
EP  - 693
SN  - 2352-5401
UR  - https://doi.org/10.2991/iccmcee-15.2015.124
DO  - 10.2991/iccmcee-15.2015.124
ID  - Zhang2015/11
ER  -