Proceedings of the International Conference on Electronics, Mechanics, Culture and Medicine

The Key Technology and Algorithm Design for the Development of Intelligent Examination System

Authors
Kai Lu, Mingrui Chen
Corresponding Author
Kai Lu
Available Online February 2016.
DOI
https://doi.org/10.2991/emcm-15.2016.141How to use a DOI?
Keywords
Intelligent examination system; Three layer development; Silverlight; Algorithm of generating test paper; Performance analysis algorithm
Abstract
Traditional examination by the teacher to choose, group, organization, after the examination, and then by the examination papers to correct, determine the results. Therefore, many factors, such as the standardization degree, the difficulty degree and the rationality of the evaluation, are more easily influenced by the subjective factors. And traditional examination group, organization, examination paper evaluation, performance analysis, test paper retained heavy workload big, such as task. In addition, the traditional test feedback ability is weak, embodied in an exam paper choose optional the gender is big, and the analysis of the results stay on average, pass the surface level. Some of the existing online examination system to achieve a paperless examination, But in the volume group, and result analysis, the basic is the same as the traditional way. This paper mainly discusses the key technology of the development of the intelligent test system, focusing on generating test paper algorithm design and achievement data mining algorithm for the analysis of the design, so as to improve the system test paper quality and performance analysis for teaching and learning in the future to provide detailed decision analysis.
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Proceedings
International Conference on Electronics, Mechanics, Culture and Medicine
Part of series
Advances in Computer Science Research
Publication Date
February 2016
ISBN
978-94-6252-163-6
ISSN
2352-538X
DOI
https://doi.org/10.2991/emcm-15.2016.141How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Kai Lu
AU  - Mingrui Chen
PY  - 2016/02
DA  - 2016/02
TI  - The Key Technology and Algorithm Design for the Development of Intelligent Examination System
BT  - International Conference on Electronics, Mechanics, Culture and Medicine
PB  - Atlantis Press
SP  - 775
EP  - 779
SN  - 2352-538X
UR  - https://doi.org/10.2991/emcm-15.2016.141
DO  - https://doi.org/10.2991/emcm-15.2016.141
ID  - Lu2016/02
ER  -