Proceedings of the 2015 International Conference on Education, Management, Information and Medicine

BP Neural Network-Based Risk Assessment for Industrialization of Patent Technology

Authors
Dongdong Lu
Corresponding Author
Dongdong Lu
Available Online April 2015.
DOI
10.2991/emim-15.2015.123How to use a DOI?
Keywords
Industrialization; Patent technology; Risk identification; Risk assessment; BPNN
Abstract

Industrialization process of patent technology is one of the most important marks to evaluate patent technology innovation ability, which affects their own survival and development in the competition. But the ratio of industrialization is still very low, because there are some restricted risks through the industrialization process. So, if a reasonable risk assessment system for industrialization of patent technology could been put forward based on the analyst for the risks, and some suitable theory could been applied for the assessment, it would do great contribution, offer objective database and implementation guidance to the industrialization of patent technology .Aim at risk assessment for industrialization of patent technology, the paper puts forward the construction of the patent industrialization index system based on the analyst for the risks. And BPNN theory could be applied for the assessment. As a case study, A University has been chosen for an example to prove the correctness of the conclusion and effectiveness of the assessment.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Education, Management, Information and Medicine
Series
Advances in Economics, Business and Management Research
Publication Date
April 2015
ISBN
10.2991/emim-15.2015.123
ISSN
2352-5428
DOI
10.2991/emim-15.2015.123How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Dongdong Lu
PY  - 2015/04
DA  - 2015/04
TI  - BP Neural Network-Based Risk Assessment for Industrialization of Patent Technology
BT  - Proceedings of the 2015 International Conference on Education, Management, Information and Medicine
PB  - Atlantis Press
SP  - 620
EP  - 624
SN  - 2352-5428
UR  - https://doi.org/10.2991/emim-15.2015.123
DO  - 10.2991/emim-15.2015.123
ID  - Lu2015/04
ER  -