Proceedings of the First International Conference on Information Sciences, Machinery, Materials and Energy

Research on Sheave Test and Optimization of Expanded Diameter Conductors JL/G1A-530(630)/45

Authors
Jiajun Si, Jiancheng Wan, Kuanjun Zhu, Jialun Yang
Corresponding Author
Jiajun Si
Available Online July 2015.
DOI
10.2991/icismme-15.2015.246How to use a DOI?
Keywords
diameter-expanded conductor; sheave test; Critical Tension; Wire Jump-out; Cross-sectional ovality Analysis
Abstract

Expanded diameter conductors are widely used for high voltage electricity power transmission. But the stability problem of its section often occurs during the construction processes, especially for the not-well-designed conductor structures. This phenomenon is typically characterized by the appearance of outer wire/wires jumping out of the layer; therefore it is also referred as wire jump-out problem. The solution is sheave test research for the study of section stability. In this paper, a kind of sheave test is introduced and a kind of ovality analysis of the expanded conductor has been designed for the study.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the First International Conference on Information Sciences, Machinery, Materials and Energy
Series
Advances in Intelligent Systems Research
Publication Date
July 2015
ISBN
10.2991/icismme-15.2015.246
ISSN
1951-6851
DOI
10.2991/icismme-15.2015.246How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Jiajun Si
AU  - Jiancheng Wan
AU  - Kuanjun Zhu
AU  - Jialun Yang
PY  - 2015/07
DA  - 2015/07
TI  - Research on Sheave Test and Optimization of Expanded Diameter Conductors JL/G1A-530(630)/45
BT  - Proceedings of the First International Conference on Information Sciences, Machinery, Materials and Energy
PB  - Atlantis Press
SP  - 1157
EP  - 1160
SN  - 1951-6851
UR  - https://doi.org/10.2991/icismme-15.2015.246
DO  - 10.2991/icismme-15.2015.246
ID  - Si2015/07
ER  -