Proceedings of the 2016 2nd International Conference on Artificial Intelligence and Industrial Engineering (AIIE 2016)

Improving Fault Localization through Fault Propagation Analysis

Authors
Zhimin Fang, Danni Li, Shifei Chen, Rong Chen
Corresponding Author
Zhimin Fang
Available Online November 2016.
DOI
10.2991/aiie-16.2016.93How to use a DOI?
Keywords
software debugging; fault localization; fault propagation; program dependency.
Abstract

Lots of studies have been done to pinpoint program faults almost to the exact line where different types of abnormal behaviors occur. Among them there is the promising testing-based fault localization (TBFL) technique, the aim of which is to locate the faults in the program automatically when the program is executed with test suite. This paper proposes an improved TBFL method augmented with fault propagation. It localizes faults in three major steps: generate the execution path and dependency information of program, modify the existing fault state of program, and ultimately infer statement suspicious score. Our empirical results show that, for the subject we studied, our technique can get better effectiveness than others. Empirical results show that our method can help to debug efficiently and get better effectiveness than other competitors.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 2nd International Conference on Artificial Intelligence and Industrial Engineering (AIIE 2016)
Series
Advances in Intelligent Systems Research
Publication Date
November 2016
ISBN
10.2991/aiie-16.2016.93
ISSN
1951-6851
DOI
10.2991/aiie-16.2016.93How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Zhimin Fang
AU  - Danni Li
AU  - Shifei Chen
AU  - Rong Chen
PY  - 2016/11
DA  - 2016/11
TI  - Improving Fault Localization through Fault Propagation Analysis
BT  - Proceedings of the 2016 2nd International Conference on Artificial Intelligence and Industrial Engineering (AIIE 2016)
PB  - Atlantis Press
SP  - 405
EP  - 409
SN  - 1951-6851
UR  - https://doi.org/10.2991/aiie-16.2016.93
DO  - 10.2991/aiie-16.2016.93
ID  - Fang2016/11
ER  -