Design of Analysis Platform Used for Studying Soft Error Characteristic of 3D SRAM
Peng Li, MinXuan Zhang, ZhenYu Zhao, Quan Deng
Available Online April 2015.
- https://doi.org/10.2991/amcce-15.2015.304How to use a DOI?
- Three-dimensional static random access memory (3D SRAM); soft error; analysis platform; cross section; single event upset (SEU); multi cell upset (MCU)
- This paper designs a novel 3D SRAM soft error analysis platform. It is used for studying the soft error characteristic of 3D SRAM stacked by multi dies and guiding the radiation hardened design for 3D SRAM. This platform integrates simulation tools including Geant4, TCAD and Nanosim, data recording and processing tools ROOT, layout processing tools Calibre, and Perl and Shell script used for linking task and analyzing results. After inputting the stacked structure, technology, circuit netlist and layout of 3D SRAM and incident particles information, this platform can simulate the particle striking 3D SRAM automatically, and then we get some kinds of cross sections, error information in a single word and sensitive node distribution for 3D SRAM. A 2 die stacked 3D SRAM based on 65nm CMOS technology is analyzed through this platform.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - Peng Li AU - MinXuan Zhang AU - ZhenYu Zhao AU - Quan Deng PY - 2015/04 DA - 2015/04 TI - Design of Analysis Platform Used for Studying Soft Error Characteristic of 3D SRAM BT - 2015 International Conference on Automation, Mechanical Control and Computational Engineering PB - Atlantis Press SN - 1951-6851 UR - https://doi.org/10.2991/amcce-15.2015.304 DO - https://doi.org/10.2991/amcce-15.2015.304 ID - Li2015/04 ER -