Proceedings of the 2017 2nd International Conference on Automation, Mechanical and Electrical Engineering (AMEE 2017)

Super-resolution Microscopy with Structured Excitation and Structured Stimulated Emission Depletion

Authors
Qingru Li, Jiang Zhang, Hua Huang, Ming Tang, Xiyue Wang, Han Zhang
Corresponding Author
Qingru Li
Available Online September 2017.
DOI
https://doi.org/10.2991/amee-17.2017.20How to use a DOI?
Keywords
resolution; fluorescence microscopy; biological imaging; image processing
Abstract

Fluorescence microscopy plays an important role in biomedical imaging because of its high sensitivity and specificity. However, the resolution of traditional fluorescence microscopy is limited due to the optical diffraction. Various techniques have been developed to surpass the diffraction limit in recent years. Among these existing methods, nonlinear structured illumination microscopy (SIM) simultaneously provides the ability of fast imaging speed, wide field of view and extended resolution improvement. However, the current developed nonlinear SIM approaches such as Saturated SIM and Photoswitching SIM have their own defects due to the strong photon bleaching and slow photoswitching speed respectively. We report a new nonlinear SIM technique based on stimulated emission depletion (STED), the illumination pattern of which combining both structured excitation field and structured STED field (SSTED-SIM). Theoretical study and simulation analysis have been conducted to demonstrate that SSTED-SIM performs better than other existing nonlinear SIM.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2017 2nd International Conference on Automation, Mechanical and Electrical Engineering (AMEE 2017)
Series
Advances in Engineering Research
Publication Date
September 2017
ISBN
978-94-6252-393-7
ISSN
2352-5401
DOI
https://doi.org/10.2991/amee-17.2017.20How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Qingru Li
AU  - Jiang Zhang
AU  - Hua Huang
AU  - Ming Tang
AU  - Xiyue Wang
AU  - Han Zhang
PY  - 2017/09
DA  - 2017/09
TI  - Super-resolution Microscopy with Structured Excitation and Structured Stimulated Emission Depletion
BT  - Proceedings of the 2017 2nd International Conference on Automation, Mechanical and Electrical Engineering (AMEE 2017)
PB  - Atlantis Press
SP  - 94
EP  - 98
SN  - 2352-5401
UR  - https://doi.org/10.2991/amee-17.2017.20
DO  - https://doi.org/10.2991/amee-17.2017.20
ID  - Li2017/09
ER  -