Separation of Surface Roughness Profile from Raw Contour based on Empirical Mode Decomposition

DOI

10.2991/ameii-15.2015.77How to use a DOI?

Keywords

Surface Roughness Profile; EMD; IMFs; Mean Line

Abstract

Engineering surfaces are comprised of different wavelength bands commonly referred to as roughness, waviness and form. The Gaussian filter is a common technique to separate surface roughness profile but it has some drawbacks. This paper presents an approach of utilizing Empirical Mode Decomposition (EMD) to separate surface roughness profile from raw contour. The EMD describes a time-signal with a series of Intrinsic Mode Functions (IMFs) and the residue. The residue and IMFs of frequency less than 10 within an evaluation length, are used for reconstructing EMD reference line. To achieve more accurate mean line, an Amplitude Weighting Factor (AWF) is applied to the IMF whose frequency is maximum among the selected IMFs. The EMD reference line is thus modified as EMD mean line. Surface roughness profile can be further separated and roughness parameters can be calculated. The comparison of EMD method and Gaussian filter is also presented.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Shoubin Liu
AU  - Hui Zhang
PY  - 2015/04
DA  - 2015/04
TI  - Separation of Surface Roughness Profile from Raw Contour based on Empirical Mode Decomposition
BT  - Proceedings of the International Conference on Advances in Mechanical Engineering and Industrial Informatics
PB  - Atlantis Press
SP  - 406
EP  - 411
SN  - 2352-5401
UR  - https://doi.org/10.2991/ameii-15.2015.77
DO  - 10.2991/ameii-15.2015.77
ID  - Liu2015/04
ER  -