Research on Industrial Control Devices Flaw Discovery Technology

DOI

10.2991/ameii-15.2015.247How to use a DOI?

Keywords

ICS; flaw discovery; fuzzing; network security.

Abstract

Industrial Control System (in short, ICS) is an important part of state fundamental infrastructure whose safety concerns national economy development and people’s property and life safety. Flaw discovery is the key of ICS defense. If attackers find flaws in ICS and use them for attack, the consequence will be unimaginable. The thesis focuses on researches about industrial control terminals flaw discovery and put forward a new flaw discovery method for industrial control terminals. We collect samples for test, basing on which we then make them produce variations. At last, we send those samples to target devices through dimmers to detect device flaws. The method uses cross-hardware and software programming data as test sample and applies genetic algorithms to design and achieve variogram, making the attack samples more comprehensive and effective.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Xi Chen
AU  - Qi Li
PY  - 2015/04
DA  - 2015/04
TI  - Research on Industrial Control Devices Flaw Discovery Technology
BT  - Proceedings of the International Conference on Advances in Mechanical Engineering and Industrial Informatics
PB  - Atlantis Press
SP  - 1341
EP  - 1346
SN  - 2352-5401
UR  - https://doi.org/10.2991/ameii-15.2015.247
DO  - 10.2991/ameii-15.2015.247
ID  - Chen2015/04
ER  -