Computational Methods for Calculating Metallographic Geometric Parameters of Melted Marks Caused by Short-circuits in Electrical Fires
- DOI
- 10.2991/ammsa-18.2018.9How to use a DOI?
- Keywords
- melted mark; metallographic structure; geometric parameter; first short circuit
- Abstract
The primary short-circuited melted marks(PSMs) are caused by short circuits before the fire occurs, usually PSMs are direct evidences that relate to the causes of electrical fire. The metallographic methods are the most common scientific methods to analyze and identify PSMs. Presently metallographic analysis of melted marks in electrical fires is still based on experience and anecdotal evidence, therefore the use of computer aided quantitative metallographic analysis in other material fields is becoming more popular. The process of melted mark crystallization includes the formation and growth of the nucleus, in which inhibitions between nuclei occur regularly; in this case, each grain has a similar formation process, and the metallographic structure of grains develop both irregularity and self-similarity. Based on fractal theory and using digital image processing, this paper analyzes the features of metallographic structures of melted marks that are caused by short-circuits, and proposes a method to classify the geometric parameters of grains of their microstructure, including the perimeter C, area S, equivalent diameter R, density P and shape factor F. Furthermore, this paper aims to discuss quantitative methods that describe the formation discipline of metallographic organization of melted marks in electrical fires.
- Copyright
- © 2018, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Mei Chai AU - Shanjun Mo PY - 2018/05 DA - 2018/05 TI - Computational Methods for Calculating Metallographic Geometric Parameters of Melted Marks Caused by Short-circuits in Electrical Fires BT - Proceedings of the 2018 2nd International Conference on Applied Mathematics, Modelling and Statistics Application (AMMSA 2018) PB - Atlantis Press SP - 42 EP - 47 SN - 1951-6851 UR - https://doi.org/10.2991/ammsa-18.2018.9 DO - 10.2991/ammsa-18.2018.9 ID - Chai2018/05 ER -