A Circuit Fast Fault Diagnosis System Developed with PODEM Algorithm
Ke Liu, Weidong Lv, Qingyu Ou, Xueguang Zhou
Available Online August 2016.
- https://doi.org/10.2991/cset-16.2016.34How to use a DOI?
- PODEM, fast fault diagnosis, BIST, SCOAP, dirigibility, observability
- This paper deeply studies the fault models of digital circuits and proposes a combined implementation of BIST test mode, on the basis of which a new implementation of PODEM is proposed. In addition, this paper also studies the generation of test vector algorithm and a fault diagnosis system for special purpose equipment is designed and implemented based on the research in this paper, which wins the 2nd prize in a province level.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - Ke Liu AU - Weidong Lv AU - Qingyu Ou AU - Xueguang Zhou PY - 2016/08 DA - 2016/08 TI - A Circuit Fast Fault Diagnosis System Developed with PODEM Algorithm BT - 2016 International Conference on Computer Science and Electronic Technology PB - Atlantis Press SP - 140 EP - 143 SN - 2352-538X UR - https://doi.org/10.2991/cset-16.2016.34 DO - https://doi.org/10.2991/cset-16.2016.34 ID - Liu2016/08 ER -