Proceedings of the 2016 International Conference on Computer Science and Electronic Technology

A Circuit Fast Fault Diagnosis System Developed with PODEM Algorithm

Authors
Ke Liu, Weidong Lv, Qingyu Ou, Xueguang Zhou
Corresponding Author
Ke Liu
Available Online August 2016.
DOI
https://doi.org/10.2991/cset-16.2016.34How to use a DOI?
Keywords
PODEM, fast fault diagnosis, BIST, SCOAP, dirigibility, observability
Abstract
This paper deeply studies the fault models of digital circuits and proposes a combined implementation of BIST test mode, on the basis of which a new implementation of PODEM is proposed. In addition, this paper also studies the generation of test vector algorithm and a fault diagnosis system for special purpose equipment is designed and implemented based on the research in this paper, which wins the 2nd prize in a province level.
Open Access
This is an open access article distributed under the CC BY-NC license.

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Proceedings
2016 International Conference on Computer Science and Electronic Technology
Part of series
Advances in Computer Science Research
Publication Date
August 2016
ISBN
978-94-6252-213-8
ISSN
2352-538X
DOI
https://doi.org/10.2991/cset-16.2016.34How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Ke Liu
AU  - Weidong Lv
AU  - Qingyu Ou
AU  - Xueguang Zhou
PY  - 2016/08
DA  - 2016/08
TI  - A Circuit Fast Fault Diagnosis System Developed with PODEM Algorithm
BT  - 2016 International Conference on Computer Science and Electronic Technology
PB  - Atlantis Press
SP  - 140
EP  - 143
SN  - 2352-538X
UR  - https://doi.org/10.2991/cset-16.2016.34
DO  - https://doi.org/10.2991/cset-16.2016.34
ID  - Liu2016/08
ER  -