The Technology Diffusion Effect of International Intellectual Returnees
Shuyun Li, Shaozhi Chen
Available Online June 2014.
- 10.2991/csss-14.2014.122How to use a DOI?
- returnees; international; technology; diffusion; threshold regression
By introducing returnees into the international R&D spillovers econometric model and using Chinese provincial panel data, we test the technological progress effects of returnees in various regions of China. The results show that returnees have played important roles in technological progress in various regions of China, but there are differences in the degrees of contribution, and the conclusions remain robust after the use of multiple tools to solve the endogenous problems of variables. Then, we set threshold models to measure the threshold levels of local fiscal revenue, economic development, etc., which can cause positive spillover effects of returnees.
- © 2014, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Shuyun Li AU - Shaozhi Chen PY - 2014/06 DA - 2014/06 TI - The Technology Diffusion Effect of International Intellectual Returnees BT - Proceedings of the 3rd International Conference on Computer Science and Service System PB - Atlantis Press SP - 521 EP - 524 SN - 1951-6851 UR - https://doi.org/10.2991/csss-14.2014.122 DO - 10.2991/csss-14.2014.122 ID - Li2014/06 ER -