Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)

The Analysis of the Cannon Gun Tube Wearing Life Based on Random Using Condition

Authors
Tian-Xiao CUI, Jie LI, Guang-Sheng LIU, Chang-Zhi JIA
Corresponding Author
Tian-Xiao CUI
Available Online September 2017.
DOI
10.2991/eeeis-17.2017.61How to use a DOI?
Keywords
Barrel Life, Ablation Wear, Continuous Fire, Highest Wall Temperature, Radial Ablation Wear
Abstract

In view of the problem that the artillery tube life is difficult to accurately forecast under the random using condition, through the analysis of the heat transfer process of the inner wall of the tube body, introducing internal heat strengthening hypothesis, the calculation method of the highest inner wall temperature is obtained and its the variation regularity of ablation wear and the maximum wall temperature is studied. At the same time, the wear calculation method comes up when artillery is shooting continuously under the circumstance of uncertain gunpowder temperature ,uncertain shooting time interval and uncertain propellant charge.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)
Series
Advances in Engineering Research
Publication Date
September 2017
ISBN
10.2991/eeeis-17.2017.61
ISSN
2352-5401
DOI
10.2991/eeeis-17.2017.61How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Tian-Xiao CUI
AU  - Jie LI
AU  - Guang-Sheng LIU
AU  - Chang-Zhi JIA
PY  - 2017/09
DA  - 2017/09
TI  - The Analysis of the Cannon Gun Tube Wearing Life Based on Random Using Condition
BT  - Proceedings of the 3rd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS 2017)
PB  - Atlantis Press
SP  - 431
EP  - 436
SN  - 2352-5401
UR  - https://doi.org/10.2991/eeeis-17.2017.61
DO  - 10.2991/eeeis-17.2017.61
ID  - CUI2017/09
ER  -