Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)

An SHTB-based experimental technique for elevated temperature

Authors
Xuan Chen, Yulong Li, Na Ouyang
Corresponding Author
Xuan Chen
Available Online September 2012.
DOI
10.2991/emeit.2012.64How to use a DOI?
Keywords
SHTB, elevated temperature, Simultaneous-Heating-and-Cooling (SHC),2D C/SiC composite, SEM
Abstract

A new experimental technique by means of split Hopkinson tensile bar (SHTB) at elevated temperature of 800 was introduced. By this technique we carried out an investigation into the dynamic properties of 2D C/SiC composite at both room and elevated temperature of 20 and 800. It was found that the failure strength and strain of 2D-C/SiC composite decreases significantly with the increase of temperature. Observation of SEM micrographs of failed specimen fracture under dynamic tensile loading at both temperatures reveals a comparatively smooth fracture and short fiber pull-out at elevated temperature of 800, and we attribute it to the oxidation or partial oxidation of the carbon fibers under dynamic loading at elevated temperature.

Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
Series
Advances in Intelligent Systems Research
Publication Date
September 2012
ISBN
10.2991/emeit.2012.64
ISSN
1951-6851
DOI
10.2991/emeit.2012.64How to use a DOI?
Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xuan Chen
AU  - Yulong Li
AU  - Na Ouyang
PY  - 2012/09
DA  - 2012/09
TI  - An SHTB-based experimental technique for elevated temperature
BT  - Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
PB  - Atlantis Press
SP  - 321
EP  - 325
SN  - 1951-6851
UR  - https://doi.org/10.2991/emeit.2012.64
DO  - 10.2991/emeit.2012.64
ID  - Chen2012/09
ER  -