Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)

Study on the Virtual Test for Reliability for Contact Stress of Gear Tooth Face

Authors
Yanyan Shi, Haochuan Li, Ge Zang, Shuangfeng Wu, Shi Ji
Corresponding Author
Yanyan Shi
Available Online September 2012.
DOI
10.2991/emeit.2012.204How to use a DOI?
Keywords
Reliability, virtual test, Weibull distribution, Box-Behnken sampling method
Abstract

Based on the technology of virtual test for reliability for the study of small sample sizes by using Box-Behnken sampling method and FEA method, the paper presents a method for studying the randomness of tooth face contact stress by using technology of virtual test for reliability. According to that the tooth face contact stress normally has the characteristic of skewed distribution, the paper presents the experimental data handing method that fitting virtual experimental data by using three-parameter weibull distribution, and then estimating the distribution parameters by using Matrix Analysis and bilinear regression analysis method together.

Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
Series
Advances in Intelligent Systems Research
Publication Date
September 2012
ISBN
10.2991/emeit.2012.204
ISSN
1951-6851
DOI
10.2991/emeit.2012.204How to use a DOI?
Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yanyan Shi
AU  - Haochuan Li
AU  - Ge Zang
AU  - Shuangfeng Wu
AU  - Shi Ji
PY  - 2012/09
DA  - 2012/09
TI  - Study on the Virtual Test for Reliability for Contact Stress of Gear Tooth Face
BT  - Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
PB  - Atlantis Press
SP  - 945
EP  - 948
SN  - 1951-6851
UR  - https://doi.org/10.2991/emeit.2012.204
DO  - 10.2991/emeit.2012.204
ID  - Shi2012/09
ER  -