Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)

2nd International Conference on Electronic & Mechanical Engineering and Information Technology

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Diagnosis method for Analog Circuits fault using Bayesian network

Authors
Peng Jiao, Xinzheng Wang, Chunrong Li
Corresponding Author
Peng Jiao
Available Online September 2012.
DOI
10.2991/emeit.2012.436How to use a DOI?
Keywords
Bayesian network, dianosis, car radio, analog circuit
Abstract

Aiming at the uncertain problem in analog circuit fault diagnosis, a new method based on Bayesian network is proposed. Given a set of measurements from the circuit, and a set of possible faults, the task is to calculate the probability that the faults are present. This paper then discusses the methodology for diagnosis and the associated procedures for block-level diagnosis of analogue circuits in detail. Finally, the correctness and effectiveness of this method are validated by the fault diagnosis result of a voltage regulator used car radio.

Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
Series
Advances in Intelligent Systems Research
Publication Date
September 2012
ISBN
978-90-78677-60-4
ISSN
1951-6851
DOI
10.2991/emeit.2012.436How to use a DOI?
Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Peng Jiao
AU  - Xinzheng Wang
AU  - Chunrong Li
PY  - 2012/09
DA  - 2012/09
TI  - Diagnosis method for Analog Circuits fault using Bayesian network
BT  - Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
PB  - Atlantis Press
SP  - 1969
EP  - 1972
SN  - 1951-6851
UR  - https://doi.org/10.2991/emeit.2012.436
DO  - 10.2991/emeit.2012.436
ID  - Jiao2012/09
ER  -