A Nondestructive Method for Measurements of Complex Permittivity of Microwave Dielectric Substrate Materials
Fei Zhao, Pei Xu, Changtao Sha, Wenfeng Wang, Jinsong Kan
Available Online August 2015.
- https://doi.org/10.2991/ic3me-15.2015.187How to use a DOI?
- dielectric substrates, microwave measurement, permittivity measurement, nondestructive testing, cavity resonator.
- A nondestructive and accurate measurement method and related apparatus based on the split-cylinder resonator techniques is descried in this paper. The dielectric constants and loss tangents of the flat substrate materials are suitable to be characterized and then calculated by software programmed according to a rigorous mode match analysis of the TE011 mode. The dielectric properties of some typical substrate materials have been measured, and measurement uncertainties are also given in this paper. In addition, the effect of sample thickness on the dielectric properties is also investigated. These results demonstrate that this technology is capable of accurately characterizing the dielectric properties of flat substrate materials versus frequency by changing the sample thickness.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - Fei Zhao AU - Pei Xu AU - Changtao Sha AU - Wenfeng Wang AU - Jinsong Kan PY - 2015/08 DA - 2015/08 TI - A Nondestructive Method for Measurements of Complex Permittivity of Microwave Dielectric Substrate Materials BT - 3rd International Conference on Material, Mechanical and Manufacturing Engineering (IC3ME 2015) PB - Atlantis Press SN - 2352-5401 UR - https://doi.org/10.2991/ic3me-15.2015.187 DO - https://doi.org/10.2991/ic3me-15.2015.187 ID - Zhao2015/08 ER -