The reflection coefficients of multilayer anti-counterfeiting optical films for S-polarized wave
Authors
Yannan Hao, Fuping Liu, Yue Xu, Anling Wang
Corresponding Author
Yannan Hao
Available Online October 2015.
- DOI
- 10.2991/icadme-15.2015.227How to use a DOI?
- Keywords
- Multilayer anti-counterfeiting optical film, reflection coefficients of light, S-polarized wave
- Abstract
Considering the difference of phase-shift direction and amplitude attenuation direction when the optical wave propagates in conductive medium, with the boundary conditions of optical wave at the interface of the media, we derive the recurrence formula reflection coefficient for the S-polarized optical wave in the multilayer film. Given a calculating example for multilayer anti-counterfeiting optical films, the result shows that thickness of metal film has important effect on the reflection coefficient of light, and the multilayer film has stronger reflection effective of narrow band.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Yannan Hao AU - Fuping Liu AU - Yue Xu AU - Anling Wang PY - 2015/10 DA - 2015/10 TI - The reflection coefficients of multilayer anti-counterfeiting optical films for S-polarized wave BT - Proceedings of the 5th International Conference on Advanced Design and Manufacturing Engineering PB - Atlantis Press SP - 1236 EP - 1239 SN - 2352-5401 UR - https://doi.org/10.2991/icadme-15.2015.227 DO - 10.2991/icadme-15.2015.227 ID - Hao2015/10 ER -