Research on Rapid Analysis for Purity of SF6 via Ion Mobility Spectrometry
- https://doi.org/10.2991/icadme-15.2015.388How to use a DOI?
- SF6, purity analysis, ion mobility spectrometry, time of flight mass spectrometry.
The detection of partial discharge and analysis of sulfur hexafluoride (SF6) purity in gas-insulated switchgears (GIS) is important for diagnosis and operating state assessment of the electric device. This paper introduced a method for rapid purity detection of SF6 based on one-way ion mobility spectrometry. The influence of flow rate, temperature and purity of SF6 on the drift time of SF6 were investigated in details. The drift time of SF6 was found to increase with the rising of impurity in SF6. A time of flight mass spectrometer was used for monitoring of decomposition products in SF6 from partial discharge. SO2, SOF2, SO2F2, SOF4 and SiF4 were found to the main discharging decomposition products, which lead to the decrease of purity of SF6.
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Liping Zhu AU - Bin Tang AU - Chenyao Liu AU - Yunguang Huang PY - 2015/10 DA - 2015/10 TI - Research on Rapid Analysis for Purity of SF6 via Ion Mobility Spectrometry BT - Proceedings of the 5th International Conference on Advanced Design and Manufacturing Engineering PB - Atlantis Press SP - 2081 EP - 2086 SN - 2352-5401 UR - https://doi.org/10.2991/icadme-15.2015.388 DO - https://doi.org/10.2991/icadme-15.2015.388 ID - Zhu2015/10 ER -