Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013)

Identification of the D-S evidence conflict based on multi-source information

Authors
NAN Feng, LI Yang
Corresponding Author
NAN Feng
Available Online March 2013.
DOI
10.2991/iccsee.2013.679How to use a DOI?
Keywords
Dempster-Shafter fusion, information distance, conflict characteristics, identification
Abstract

TO solve the applying constraints problem of D-S evidence conflict in multi-information fusion and achieve the systematic identification of evidence conflict we introduce the K-L information on the distance function to describe the characteristics of the conflict between the evidence in the paper, construct the distance matrix defined the level of conflict of independent evidence in the whole system. Simulating results show that: the effective conflict identification of K-L information distance can complete the application constraint of D-S theory’s synthetic rule, obtaining the optimized convergence results for synthesis of normal conflicting evidences, isolating the highly conflicting evidence.

Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013)
Series
Advances in Intelligent Systems Research
Publication Date
March 2013
ISBN
10.2991/iccsee.2013.679
ISSN
1951-6851
DOI
10.2991/iccsee.2013.679How to use a DOI?
Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - NAN Feng
AU  - LI Yang
PY  - 2013/03
DA  - 2013/03
TI  - Identification of the D-S evidence conflict based on multi-source information
BT  - Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013)
PB  - Atlantis Press
SP  - 2725
EP  - 2728
SN  - 1951-6851
UR  - https://doi.org/10.2991/iccsee.2013.679
DO  - 10.2991/iccsee.2013.679
ID  - Feng2013/03
ER  -