Proceedings of the 2014 International Conference on Computer Science and Electronic Technology

Study of the Method for Single Missile Storage Life Evaluation Based on Test Data

Authors
Wen Jun Xi, Wen Shuang Wang
Corresponding Author
Wen Jun Xi
Available Online January 2015.
DOI
10.2991/iccset-14.2015.102How to use a DOI?
Keywords
missile; storage life evaluation; mobile standard deviation
Abstract

To investigate the storage life evaluation method for single missile. The regular status test data was statistically analyzed, the variation of the test data was determined. The stability of the test data was discussed through the introduction of the “Mobile Standard Deviation (MSD)”conception. The MSD, which is one of the most important characteristic parameters of the missile, was forecasted with the application polynomial least-squares, the missile storage stability level was calculated, and the single missile storage life evaluation model was established. Through the case analysis, the rationality of the evaluation model was validated.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2014 International Conference on Computer Science and Electronic Technology
Series
Advances in Computer Science Research
Publication Date
January 2015
ISBN
10.2991/iccset-14.2015.102
ISSN
2352-538X
DOI
10.2991/iccset-14.2015.102How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Wen Jun Xi
AU  - Wen Shuang Wang
PY  - 2015/01
DA  - 2015/01
TI  - Study of the Method for Single Missile Storage Life Evaluation Based on Test Data
BT  - Proceedings of the 2014 International Conference on Computer Science and Electronic Technology
PB  - Atlantis Press
SP  - 462
EP  - 465
SN  - 2352-538X
UR  - https://doi.org/10.2991/iccset-14.2015.102
DO  - 10.2991/iccset-14.2015.102
ID  - Xi2015/01
ER  -