Proceedings of the 2016 4th International Conference on Electrical & Electronics Engineering and Computer Science (ICEEECS 2016)

Models for orbital debris and its optional solutions

Authors
Yuwei Ni, Jiahui Bi, Yilin Hou
Corresponding Author
Yuwei Ni
Available Online December 2016.
DOI
10.2991/iceeecs-16.2016.168How to use a DOI?
Keywords
Orbital debris; Factor analysis; Grey Forecasting Model
Abstract

The problem of the total number of orbit debris in the future has been the center of public attention for a long time. On the basis of statistics data and accurate calculation, the paper builds models and set up a model system. Then combine reality and define six possible factors affect the volume of space junk. Using correlation analysis, the experiment determines the final four key factors: the annual number of failure of spacecraft launch, the number of annual retired spacecraft which will be junk, the amount of collision arising from avalanche effect, junk self-consumption. In the basis of this analysis, establishing Gray Forecast Model to predict the annual number of space junk in the next two centuries and find that there will be a substantial junk increase in the predictable future.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 4th International Conference on Electrical & Electronics Engineering and Computer Science (ICEEECS 2016)
Series
Advances in Computer Science Research
Publication Date
December 2016
ISBN
10.2991/iceeecs-16.2016.168
ISSN
2352-538X
DOI
10.2991/iceeecs-16.2016.168How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yuwei Ni
AU  - Jiahui Bi
AU  - Yilin Hou
PY  - 2016/12
DA  - 2016/12
TI  - Models for orbital debris and its optional solutions
BT  - Proceedings of the 2016 4th International Conference on Electrical & Electronics Engineering and Computer Science (ICEEECS 2016)
PB  - Atlantis Press
SP  - 870
EP  - 874
SN  - 2352-538X
UR  - https://doi.org/10.2991/iceeecs-16.2016.168
DO  - 10.2991/iceeecs-16.2016.168
ID  - Ni2016/12
ER  -