Proceedings of the 2016 4th International Conference on Electrical & Electronics Engineering and Computer Science (ICEEECS 2016)

Defect detection based on two different algorithms of analysis and comparison

Authors
Xiaowei Zhang, Xiujuan Fan
Corresponding Author
Xiaowei Zhang
Available Online December 2016.
DOI
https://doi.org/10.2991/iceeecs-16.2016.204How to use a DOI?
Keywords
Hilbert-Huang transform; Fabric defect detection; cross-correlation; OpenCV
Abstract
Fabric defect detection has been an active area of research since a long time and still a robust system is needed which can fulfill industrial requirements. A robust automatic fabric defect detection system (FDDS) would results in quality products and more revenues. Many different approaches and method have been tried to implement FDDS. This paper presents a new scheme for automated FDDS implementation using Hilbert-Huang Transform (HHT) and also compares it with OpenCV approach. In my implementation of both approaches in same environment, the HHT approach produces higher defect detection accuracies than OpenCV approach and more computationally efficient. The article is divided into four parts, the first part is the introduction of two methods, the second part for the two methods defect detection system implementation, the third part is the results and the discussion of two methods, the fourth part is the conclusion.
Open Access
This is an open access article distributed under the CC BY-NC license.

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Proceedings
2016 4th International Conference on Electrical & Electronics Engineering and Computer Science (ICEEECS 2016)
Part of series
Advances in Computer Science Research
Publication Date
December 2016
ISBN
978-94-6252-265-7
ISSN
2352-538X
DOI
https://doi.org/10.2991/iceeecs-16.2016.204How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Xiaowei Zhang
AU  - Xiujuan Fan
PY  - 2016/12
DA  - 2016/12
TI  - Defect detection based on two different algorithms of analysis and comparison
BT  - 2016 4th International Conference on Electrical & Electronics Engineering and Computer Science (ICEEECS 2016)
PB  - Atlantis Press
SN  - 2352-538X
UR  - https://doi.org/10.2991/iceeecs-16.2016.204
DO  - https://doi.org/10.2991/iceeecs-16.2016.204
ID  - Zhang2016/12
ER  -