Outlier Detection and Processing Technology and Its Application
Authors
Yong Wang, Jiahe Cui, Zebao Zhang, Zhigang Li
Corresponding Author
Yong Wang
Available Online December 2016.
- DOI
- 10.2991/icmcm-16.2016.5How to use a DOI?
- Keywords
- Outlier detection;Data cleaning;Attribute anomalies;Duplicatedrecords.
- Abstract
Faced with the development of information technology and the arrival of the era of big data, data has become the advanced productive forces and strategic resources. However, the existence of outliers often has a negative impact on the storageand analysis of the data, andeven causes disastrous consequences. This paper starts with the definition, concept and classification of outliers, and then compares and analyzes various methods of outlier detection and cleaning technology based on attribute anomaly and the duplicate or similarrecords.Finally, the research and application of outliers are prospected.
- Copyright
- © 2016, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Yong Wang AU - Jiahe Cui AU - Zebao Zhang AU - Zhigang Li PY - 2016/12 DA - 2016/12 TI - Outlier Detection and Processing Technology and Its Application BT - Proceedings of the 2016 7th International Conference on Mechatronics, Control and Materials (ICMCM 2016) PB - Atlantis Press SP - 18 EP - 24 SN - 2352-5401 UR - https://doi.org/10.2991/icmcm-16.2016.5 DO - 10.2991/icmcm-16.2016.5 ID - Wang2016/12 ER -