Proceedings of the 2nd International Conference on Mechatronics Engineering and Information Technology (ICMEIT 2017)

Analyzing the Characteristics of Simulated E-field Environment of Reverberation Chamber

Authors
Kaifu Ji, Guanghui Wei, Xiaodong Pan, Haojiang Wan
Corresponding Author
Kaifu Ji
Available Online May 2017.
DOI
10.2991/icmeit-17.2017.47How to use a DOI?
Keywords
Reverberation Chamber; Degree of Fitting; KS Test.
Abstract

This paper analyzes the statistical characteristics of the ideal reverberation chamber environment, and evaluate the simulated reverberation room environment at different frequencies based on the KS test, to test the degree of fitting between the simulated E-field environment and theoretical reverberation chamber environment. The results show that the probability of accepting the original hypothesis in the simulation is high, the model can be used in the simulation analysis of the reverberation chamber.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Mechatronics Engineering and Information Technology (ICMEIT 2017)
Series
Advances in Computer Science Research
Publication Date
May 2017
ISBN
10.2991/icmeit-17.2017.47
ISSN
2352-538X
DOI
10.2991/icmeit-17.2017.47How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Kaifu Ji
AU  - Guanghui Wei
AU  - Xiaodong Pan
AU  - Haojiang Wan
PY  - 2017/05
DA  - 2017/05
TI  - Analyzing the Characteristics of Simulated E-field Environment of Reverberation Chamber
BT  - Proceedings of the 2nd International Conference on Mechatronics Engineering and Information Technology (ICMEIT 2017)
PB  - Atlantis Press
SP  - 251
EP  - 254
SN  - 2352-538X
UR  - https://doi.org/10.2991/icmeit-17.2017.47
DO  - 10.2991/icmeit-17.2017.47
ID  - Ji2017/05
ER  -