The Research on One Feasible Test Strategy for Temperature Rising Limits of Low-Voltage Metering Cabinets

DOI

10.2991/icmia-16.2016.131How to use a DOI?

Keywords

Low-voltage metering cabinet, Temperature rising limit, Grey model, Test strategy.

Abstract

The consumption of electric power is increasing with the continuous development of China's economy. The temperature rising limits testing is the important performance for low-voltage metering cabinets and circuit breakers. The strategy for temperature rising testing usually had many questions such as the style of thermocouple pasting, long testing time, the randomness by operator and so on. According to amount experiences for low-voltage metering cabinet, a good strategy for temperature rising limit testing was proposed in the paper. Meanwhile, the grey model used to analysis the temperature rising data for the growth trend of data itself.

Copyright

© 2016, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

TY  - CONF
AU  - Hua Shen
AU  - Sheng Chen
AU  - Penghe Zhang
AU  - Feng Wang
AU  - Haohan Zhen
PY  - 2016/11
DA  - 2016/11
TI  - The Research on One Feasible Test Strategy for Temperature Rising Limits of Low-Voltage Metering Cabinets
BT  - Proceedings of the 2016 5th International Conference on Measurement, Instrumentation and Automation (ICMIA 2016)
PB  - Atlantis Press
SN  - 1951-6851
UR  - https://doi.org/10.2991/icmia-16.2016.131
DO  - 10.2991/icmia-16.2016.131
ID  - Shen2016/11
ER  -