Proceedings of the 4th International Conference on Mechatronics, Materials, Chemistry and Computer Engineering 2015

The Quality Evaluation Method Research on Cloud Cover Image Based on Statistical Analysis

Authors
Yanjie Wang, Jianjun Zhou, Li Jia
Corresponding Author
Yanjie Wang
Available Online December 2015.
DOI
10.2991/icmmcce-15.2015.201How to use a DOI?
Keywords
Cloud cover; Image quality evaluation; Statistical model; Geometry dimensions; Angular second moment
Abstract

Cloud cover is a key factor which affects the quality of aerial and remote sensing image. In order to precisely evaluate the impact which brought by cloud cover, article constructs a cloud detection algorithm which suits for aerial image according to cloud statistical characters; analyzing the cloud region, and building a model on the basis of the image quality comprehensive assessment of the thick cloud, thin cloud, possible cloud and cloudless region; at last, utilizing experts’ subjective guidance to improve the evaluation model. The algorithm can efficiently and precisely evaluate the aerial cloud cover image on the account massive test data.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 4th International Conference on Mechatronics, Materials, Chemistry and Computer Engineering 2015
Series
Advances in Computer Science Research
Publication Date
December 2015
ISBN
10.2991/icmmcce-15.2015.201
ISSN
2352-538X
DOI
10.2991/icmmcce-15.2015.201How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yanjie Wang
AU  - Jianjun Zhou
AU  - Li Jia
PY  - 2015/12
DA  - 2015/12
TI  - The Quality Evaluation Method Research on Cloud Cover Image Based on Statistical Analysis
BT  - Proceedings of the 4th International Conference on Mechatronics, Materials, Chemistry and Computer Engineering 2015
PB  - Atlantis Press
SP  - 1033
EP  - 1037
SN  - 2352-538X
UR  - https://doi.org/10.2991/icmmcce-15.2015.201
DO  - 10.2991/icmmcce-15.2015.201
ID  - Wang2015/12
ER  -