Proceedings of the 4th International Conference on Mechatronics, Materials, Chemistry and Computer Engineering 2015

Research on Memory Leakage Monitoring Based on Android Mobile Platform

Authors
Di Zhou, Peixing Yang
Corresponding Author
Di Zhou
Available Online December 2015.
DOI
https://doi.org/10.2991/icmmcce-15.2015.253How to use a DOI?
Keywords
Memory Leakage, Monitoring, Control, Android
Abstract

An excellent Android application shall not only have perfect function, but also have good user experience. Actually, performance is an important factor influencing user experience. Memory leakage is a common performance problem in Android development, and DDMS with a good memory monitoring tool Heap in Android tools can detect the memory change of a process. By virtue of this tool, we can roughly test whether an application has memory leakage probability, thus to explain the whole process of a memory leakage problem, namely from problem discovery to analysis & location and to final solution.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the 4th International Conference on Mechatronics, Materials, Chemistry and Computer Engineering 2015
Series
Advances in Computer Science Research
Publication Date
December 2015
ISBN
978-94-6252-133-9
ISSN
2352-538X
DOI
https://doi.org/10.2991/icmmcce-15.2015.253How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Di Zhou
AU  - Peixing Yang
PY  - 2015/12
DA  - 2015/12
TI  - Research on Memory Leakage Monitoring Based on Android Mobile Platform
BT  - Proceedings of the 4th International Conference on Mechatronics, Materials, Chemistry and Computer Engineering 2015
PB  - Atlantis Press
SN  - 2352-538X
UR  - https://doi.org/10.2991/icmmcce-15.2015.253
DO  - https://doi.org/10.2991/icmmcce-15.2015.253
ID  - Zhou2015/12
ER  -