Proceedings of the 2016 4th International Conference on Machinery, Materials and Computing Technology

Research on Capacitor Bank Failure Processing Methods

Authors
Rui Tong, Jiyong Liu, Ning Wang, Ruiguo Chen, Qinghao Wang, Yanjun Pang, Bo Zhang, Hainan Su, Yue Yang, Enlu Wang, Wenguang Zhang
Corresponding Author
Rui Tong
Available Online March 2016.
DOI
10.2991/icmmct-16.2016.274How to use a DOI?
Keywords
tapped; discharge coil; unbalanced voltage; voltage ratio
Abstract

Aiming to the problem of running with the capacitor bank balance protection action causing tripping, by on-site analysis of the phenomenon and the capacitor discharge coil voltage ratio test checks, secondary coil voltage has relatively large errors caused by the tapped discharge coil. When the system voltage fluctuations, voltage unbalance will break through the setting value, causing balance protection action conclusions; proposed discharge coil tapped in the transfer test or tuning capacitor bank balance protection action value, the voltage ratio between whole primary and secondary should be checked of the discharge coil.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 4th International Conference on Machinery, Materials and Computing Technology
Series
Advances in Engineering Research
Publication Date
March 2016
ISBN
10.2991/icmmct-16.2016.274
ISSN
2352-5401
DOI
10.2991/icmmct-16.2016.274How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Rui Tong
AU  - Jiyong Liu
AU  - Ning Wang
AU  - Ruiguo Chen
AU  - Qinghao Wang
AU  - Yanjun Pang
AU  - Bo Zhang
AU  - Hainan Su
AU  - Yue Yang
AU  - Enlu Wang
AU  - Wenguang Zhang
PY  - 2016/03
DA  - 2016/03
TI  - Research on Capacitor Bank Failure Processing Methods
BT  - Proceedings of the 2016 4th International Conference on Machinery, Materials and Computing Technology
PB  - Atlantis Press
SP  - 1391
EP  - 1394
SN  - 2352-5401
UR  - https://doi.org/10.2991/icmmct-16.2016.274
DO  - 10.2991/icmmct-16.2016.274
ID  - Tong2016/03
ER  -