Research on Transformer Test Source based on Triple-frequency
Qinghao Wang, Xinyu Li, Chenyang Liu, Hongzhi Jiao, Yang Hu, Chengcheng Yue, Qiang Liu, Wenlong Zhu, Kaizhi Wang, Fengwei Sun, Yingying Yang
Available Online March 2016.
- https://doi.org/10.2991/icmmct-16.2016.280How to use a DOI?
- transformer; short circuit test; triple-frequency; research
- The purposes of measuring the transformer load losses and short-circuit impedance are checking whether they can meet the standard requirements. The traditional transformer short circuit test method were analyzed in theory and combined with engineering practice, how to improve test methods have been researched and explored is this paper. The proposed method can provide a good theoretical basis and experimental evidence for the transformer short circuit test.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - Qinghao Wang AU - Xinyu Li AU - Chenyang Liu AU - Hongzhi Jiao AU - Yang Hu AU - Chengcheng Yue AU - Qiang Liu AU - Wenlong Zhu AU - Kaizhi Wang AU - Fengwei Sun AU - Yingying Yang PY - 2016/03 DA - 2016/03 TI - Research on Transformer Test Source based on Triple-frequency BT - Proceedings of the 2016 4th International Conference on Machinery, Materials and Computing Technology PB - Atlantis Press SP - 1415 EP - 1418 SN - 2352-5401 UR - https://doi.org/10.2991/icmmct-16.2016.280 DO - https://doi.org/10.2991/icmmct-16.2016.280 ID - Wang2016/03 ER -