Experiments and Evaluation Based Pixellated CZT Semiconductor Detector
- Min Shen, Zhi-ling Tang
- Corresponding Author
- Min Shen
Available Online April 2013.
- https://doi.org/10.2991/icsem.2013.95How to use a DOI?
- Cadmium zinc telluride, semiconductor detector, Indium contacts, dark current
- Cadmium zinc telluride (CZT) material is one of the preferred materials for the fabrication of X-ray and gamma-ray detector. In this paper, it is presented an experimental detector system based on pixellated CZT semiconductor detector. At the same time, some research and design on the surface signal-readout method and the preamplifier circuitry is made. The signal coming from the CdZnTe material exposed to the radiation through the experiment is successfully required. The collection-efficiency between the electron and the hole in the anode is test when the different bias is applied in the pixellated CZT semiconductor detector. The parameter of the CZT detector and validate the responsive effect for the radiation is evaluated.The experiments and evaluation basis for the development of subsequent gamma spectrometer.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - Min Shen AU - Zhi-ling Tang PY - 2013/04 DA - 2013/04 TI - Experiments and Evaluation Based Pixellated CZT Semiconductor Detector BT - 2nd International Conference On Systems Engineering and Modeling (ICSEM-13) PB - Atlantis Press SN - 1951-6851 UR - https://doi.org/10.2991/icsem.2013.95 DO - https://doi.org/10.2991/icsem.2013.95 ID - Shen2013/04 ER -