Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference

The Comparison between one and two dimensional up-and-down Method

Authors
Huan Xue, Yuxi Ma, Rui Ge, Long Yan, Lanxiang Kuang
Corresponding Author
Huan Xue
Available Online March 2015.
DOI
10.2991/iiicec-15.2015.103How to use a DOI?
Keywords
WL700; Two dimensional up-and down Method; Fatigue Limit Strength; Relative Derivation.
Abstract

The fatigue performances of two types of the automotive frame steel (AFS) include WL700 and WL510 are investigated. In order to take the thickness effect into account, two series of WL510 samples with 6mm and 8mm thickness respectively are selected. The fatigue strengths are calculated by one and two dimensional up-and-down method under dfifferent probability of failure and believe. The result shows that the relative deviation of fatigue strength using one dimensional method is much 3 to 4 times larger than two dimensional method. In addition, more experienced data brings more accurate result. The relative deviation of fatigue strengths become larger, when the probability of failure increased and probability of believe decreased.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference
Series
Advances in Computer Science Research
Publication Date
March 2015
ISBN
10.2991/iiicec-15.2015.103
ISSN
2352-538X
DOI
10.2991/iiicec-15.2015.103How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Huan Xue
AU  - Yuxi Ma
AU  - Rui Ge
AU  - Long Yan
AU  - Lanxiang Kuang
PY  - 2015/03
DA  - 2015/03
TI  - The Comparison between one and two dimensional up-and-down Method
BT  - Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference
PB  - Atlantis Press
SP  - 450
EP  - 453
SN  - 2352-538X
UR  - https://doi.org/10.2991/iiicec-15.2015.103
DO  - 10.2991/iiicec-15.2015.103
ID  - Xue2015/03
ER  -