Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference

Compound System Reliability Test Design Based on Bayesian Approach and Monte Carlo Method

Authors
Anyang Zhang, Qi Liu
Corresponding Author
Anyang Zhang
Available Online March 2015.
DOI
10.2991/iiicec-15.2015.113How to use a DOI?
Keywords
Reliability test design; Information fusion; CSRTD; Bayesian approach; Monte Carlo method.
Abstract

Analyzing the current lack of reliability test design and considering the producer’s risk and consumer’s risk, the reliability test design model for compound system (CSRTD) based on information fusion was constructed. Analyzing the requirements and constraint conditions of reliability test design, the information fusion technology between binomial distributed subsystems and their system was presented by means of Bayesian approach and Monte Carlo method. According to posteriori risk criteria, the formulas of producer’s risk and consumer’s risk were deduced. The solution of computing the optimum test plan was given by Matlab software. Finally, an example of missile launching installation was given to demonstrate the validity of the model.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference
Series
Advances in Computer Science Research
Publication Date
March 2015
ISBN
10.2991/iiicec-15.2015.113
ISSN
2352-538X
DOI
10.2991/iiicec-15.2015.113How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Anyang Zhang
AU  - Qi Liu
PY  - 2015/03
DA  - 2015/03
TI  - Compound System Reliability Test Design Based on Bayesian Approach and Monte Carlo Method
BT  - Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference
PB  - Atlantis Press
SP  - 492
EP  - 498
SN  - 2352-538X
UR  - https://doi.org/10.2991/iiicec-15.2015.113
DO  - 10.2991/iiicec-15.2015.113
ID  - Zhang2015/03
ER  -