Proceedings of the 2017 2nd International Symposium on Advances in Electrical, Electronics and Computer Engineering (ISAEECE 2017)

A Static Voltage Stability Index base on the Network Admittance Matrix

Authors
Shuyu Zhang, Qiang Gui, Qinyong Zhou
Corresponding Author
Shuyu Zhang
Available Online March 2017.
DOI
10.2991/isaeece-17.2017.66How to use a DOI?
Keywords
static voltage stability; voltage stability index; network admittance matrix; voltage weak area
Abstract

A static voltage stability index base on the network admittance matrix is proposed in this paper, in order to measure static voltage stability at each bus. Compared with the existing analysis indexes, this index has the advantages of fast calculation, wide applicability and high accuracy. In this paper, the performance of the IEEE-39 system is simulated and analyzed, and the static voltage stability of Beijing power grid is studied by using the index. The results show that the index can well reflect the bus voltage stability under various operating conditions, and can be used to determine the system's weak voltage area by comparing the index values of each bus.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2017 2nd International Symposium on Advances in Electrical, Electronics and Computer Engineering (ISAEECE 2017)
Series
Advances in Engineering Research
Publication Date
March 2017
ISBN
10.2991/isaeece-17.2017.66
ISSN
2352-5401
DOI
10.2991/isaeece-17.2017.66How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Shuyu Zhang
AU  - Qiang Gui
AU  - Qinyong Zhou
PY  - 2017/03
DA  - 2017/03
TI  - A Static Voltage Stability Index base on the Network Admittance Matrix
BT  - Proceedings of the 2017 2nd International Symposium on Advances in Electrical, Electronics and Computer Engineering (ISAEECE 2017)
PB  - Atlantis Press
SP  - 344
EP  - 348
SN  - 2352-5401
UR  - https://doi.org/10.2991/isaeece-17.2017.66
DO  - 10.2991/isaeece-17.2017.66
ID  - Zhang2017/03
ER  -