Software Reliability Modelling Considering both Testing Effort and Testing Coverage
- DOI
- 10.2991/isci-15.2015.20How to use a DOI?
- Keywords
- Software Reliability Modeling; NHPP; Testing Effort; Testing Coverage
- Abstract
Considering testing effort function (TEF) or testing coverage function (TCF) in the non-homogeneous Poisson process (NHPP) software reliability modeling can further improve the fitting and prediction performance of the NHPP software reliability growth models (SRGMs). Thus this paper discusses how to integrate both TEF and TCF into the traditional NHPP software reliability modeling process to capture the integrated effect of testing effort and testing coverage on reliability estimation. First we present a new TEF, i.e. the inflected S-shaped TEF (IS-TEF) for describing the S-shaped varying trend of the testing-effort increasing rate more accurately. Meanwhile, a new NHPP SRGM (named IS-SRGM) which considers the IS-TEF is proposed. Then a comprehensive modeling framework for incorporating the TEF and TCF is proposed. Recur to this framework, a new NHPP SRGM (named IS-LO-SRGM) with both the IS-TEF and logistic TCF (LO-TCF) is proposed. Finally, two case studies for validating the effectiveness of the IS-TEF and the IS-LO-SRGM in terms of fitting results are presented. The results show that: the comprehensive modeling framework to incorporate the TEF and the TCF in NHPP SRGMs achieves a substantial improvement compared with the NHPP SRGMs which only consider the TEF or the TCF.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Chang Liu AU - Yuan Liu AU - Zhanyong Ren AU - Haifeng Li PY - 2015/01 DA - 2015/01 TI - Software Reliability Modelling Considering both Testing Effort and Testing Coverage BT - Proceedings of the 2015 International Symposium on Computers & Informatics PB - Atlantis Press SP - 130 EP - 135 SN - 2352-538X UR - https://doi.org/10.2991/isci-15.2015.20 DO - 10.2991/isci-15.2015.20 ID - Liu2015/01 ER -