Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering

A Novel Calibration Method for Object Plane Tilt Angle Measurement in Microscope System

Authors
Li Cui, Mei Yu
Corresponding Author
Li Cui
Available Online April 2015.
DOI
10.2991/isrme-15.2015.132How to use a DOI?
Keywords
Microscopes; Camera calibration; Rotating disks; Flexible structures; Imaging geometry
Abstract

A novel calibration method is proposed to measure object plane tilt angle in microscope system with small-depth-field. The proposed method is constructed by a space model about calibration board and the surface of image. Only a otating disk, a goniometer and a calibration board with some features are needed, the tilt angle between the object plane and image plane and their geometric relationship can be estimated by the space model. Compared with some classical calibration methods with expensive equipment, the proposed method is easy to be implemented with relative cheap equipments. Moreover, it has been proved that the proposed method is quite efficient through experimental verification. It can also contribute to three dimensional applications in computer vision of microsystems.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering
Series
Advances in Intelligent Systems Research
Publication Date
April 2015
ISBN
10.2991/isrme-15.2015.132
ISSN
1951-6851
DOI
10.2991/isrme-15.2015.132How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Li Cui
AU  - Mei Yu
PY  - 2015/04
DA  - 2015/04
TI  - A Novel Calibration Method for Object Plane Tilt Angle Measurement in Microscope System
BT  - Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering
PB  - Atlantis Press
SP  - 654
EP  - 660
SN  - 1951-6851
UR  - https://doi.org/10.2991/isrme-15.2015.132
DO  - 10.2991/isrme-15.2015.132
ID  - Cui2015/04
ER  -