Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering

Interval estimation of reliability parameters in reliability engineering

Authors
Ming Han
Corresponding Author
Ming Han
Available Online April 2015.
DOI
10.2991/isrme-15.2015.189How to use a DOI?
Keywords
reliability engineering, failure rate, exponential distribution, zero-failure data, two-sided confidence limits.
Abstract

For the reliability evaluation of such expensive and high quality products as those used in aviation and spacecraft, this study gives the two-sided confidence limits estimation of reliability parameters for exponential distribution: average life, reliability and reliability life, in the case of zero-failure data. Calculation performed on practical problems show that the provided method is feasible and easy to operation in reliability engineering.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering
Series
Advances in Intelligent Systems Research
Publication Date
April 2015
ISBN
10.2991/isrme-15.2015.189
ISSN
1951-6851
DOI
10.2991/isrme-15.2015.189How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Ming Han
PY  - 2015/04
DA  - 2015/04
TI  - Interval estimation of reliability parameters in reliability engineering
BT  - Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering
PB  - Atlantis Press
SP  - 913
EP  - 916
SN  - 1951-6851
UR  - https://doi.org/10.2991/isrme-15.2015.189
DO  - 10.2991/isrme-15.2015.189
ID  - Han2015/04
ER  -