Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering

Research on dark noise features of CMOS image sensor

Authors
Lingxiao Li, Jinho Kim, Guangmang Cui, Zhihai Xu, Huajun Feng, Qi Li, Yueting Chen
Corresponding Author
Lingxiao Li
Available Online April 2015.
DOI
https://doi.org/10.2991/isrme-15.2015.444How to use a DOI?
Keywords
CMOS image sensor; Dark noise; Time distribution; Spatial distribution
Abstract

In this paper, the noises of images taken by Cannon40D and CMOS industrial camera are analyzed both in time and space domain without outside illumination. The dark random noise associated with time is very low, which means the system noise is almost uncorrelated with time. However, system noise in the center of the CMOS image sensor is lower than those in the marginal area, which suggests the noise presents a certain spatial distribution. Finally, taking the temperature effect into consideration, we find the relationship between the maximum noise and temperature.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering
Series
Advances in Intelligent Systems Research
Publication Date
April 2015
ISBN
978-94-62520-59-2
ISSN
1951-6851
DOI
https://doi.org/10.2991/isrme-15.2015.444How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Lingxiao Li
AU  - Jinho Kim
AU  - Guangmang Cui
AU  - Zhihai Xu
AU  - Huajun Feng
AU  - Qi Li
AU  - Yueting Chen
PY  - 2015/04
DA  - 2015/04
TI  - Research on dark noise features of CMOS image sensor
BT  - Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering
PB  - Atlantis Press
SP  - 2144
EP  - 2147
SN  - 1951-6851
UR  - https://doi.org/10.2991/isrme-15.2015.444
DO  - https://doi.org/10.2991/isrme-15.2015.444
ID  - Li2015/04
ER  -