A Baseline-based BIST Design Model for Software Testability
Authors
Junhua Sui, Jianxin Wang, Huina Liu, Liquan Liu
Corresponding Author
Junhua Sui
Available Online November 2015.
- DOI
- 10.2991/itms-15.2015.341How to use a DOI?
- Keywords
- baseline; BIST; observability; software testability design
- Abstract
Software testability design is an important approach of improving software testability. Based on the baseline model embodying the observability of data processing, a new effective software testability design model BBDM is proposed through using hardware BIST for reference. This model can improve software testability, reduce the whole cost of software life cycle, and make for the automation of data analysis and testing case generation.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Junhua Sui AU - Jianxin Wang AU - Huina Liu AU - Liquan Liu PY - 2015/11 DA - 2015/11 TI - A Baseline-based BIST Design Model for Software Testability BT - Proceedings of the 2015 International Conference on Industrial Technology and Management Science PB - Atlantis Press SP - 1395 EP - 1399 SN - 2352-538X UR - https://doi.org/10.2991/itms-15.2015.341 DO - 10.2991/itms-15.2015.341 ID - Sui2015/11 ER -