Proceedings of the 2nd Information Technology and Mechatronics Engineering Conference (ITOEC 2016)

Mobile Banking Satisfaction: An Empirical Research

Authors
Zuo Renshu, Li Hongming
Corresponding Author
Zuo Renshu
Available Online May 2016.
DOI
10.2991/itoec-16.2016.74How to use a DOI?
Keywords
Mobile Banking, TAM, Satisfaction, Structural Equation Model
Abstract

With the development of mobile internet, mobile banking have been gaining a meaningful development and success. A lot of consumers use mobile banking to deal with banking affairs. Because that improves their performances startling. Based on Technology Acceptance Model (TAM), the author collected a sample of 265 people from 60 cities or 21 provinces to study mobile banking satisfaction in China. LISREL 8.70 is used to analyze the structural equation model (SEM), finding that 90% of variance can be explained by the model. That means the model constructed is appropriately. In additional, trust, perceived ease of use and perceived efficacy all have a strong positive effect on mobile banking satisfaction. Interestingly, perceived security only exerts a limited effect on satisfaction.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the 2nd Information Technology and Mechatronics Engineering Conference (ITOEC 2016)
Series
Advances in Engineering Research
Publication Date
May 2016
ISBN
10.2991/itoec-16.2016.74
ISSN
2352-5401
DOI
10.2991/itoec-16.2016.74How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Zuo Renshu
AU  - Li Hongming
PY  - 2016/05
DA  - 2016/05
TI  - Mobile Banking Satisfaction: An Empirical Research
BT  - Proceedings of the 2nd Information Technology and Mechatronics Engineering Conference (ITOEC 2016)
PB  - Atlantis Press
SP  - 389
EP  - 392
SN  - 2352-5401
UR  - https://doi.org/10.2991/itoec-16.2016.74
DO  - 10.2991/itoec-16.2016.74
ID  - Renshu2016/05
ER  -