Proceedings of the 2018 3rd International Workshop on Materials Engineering and Computer Sciences (IWMECS 2018)

Study on self repairing method for transient fault and low energy consumption of digital circuit

Authors
Huiling Si
Corresponding Author
Huiling Si
Available Online April 2018.
DOI
https://doi.org/10.2991/iwmecs-18.2018.86How to use a DOI?
Keywords
Digital circuit, transient fault, low energy consumption, self repairing.
Abstract
at present, most of the digital circuit transient fault repair methods need to be completed by manual processing, the repair efficiency is low and the energy consumption is high. For this, put forward a new kind of digital circuit fault transient low energy self repair method, design a repair system, which is mainly composed of self reconfiguration control module and execution module, self-discipline of the core control module is embedded Nios processor, digital circuit in the presence of transient fault, the wavelet neural network algorithm the diagnosis of digital circuit transient fault judging circuit, whether the normal operation of. The reconfiguration execution module consists of a logical computing node LC and an internal interconnection network. The main function is to maintain the function of the digital circuit and carry out the information transmission between the other modules. The experimental results show that the proposed method can effectively diagnose the fault, the success rate and the average fitness of the fault repair are high, and the overall performance is strong.
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Proceedings
2018 3rd International Workshop on Materials Engineering and Computer Sciences (IWMECS 2018)
Part of series
Advances in Computer Science Research
Publication Date
April 2018
ISBN
978-94-6252-491-0
ISSN
2352-538X
DOI
https://doi.org/10.2991/iwmecs-18.2018.86How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Huiling Si
PY  - 2018/04
DA  - 2018/04
TI  - Study on self repairing method for transient fault and low energy consumption of digital circuit
BT  - 2018 3rd International Workshop on Materials Engineering and Computer Sciences (IWMECS 2018)
PB  - Atlantis Press
SN  - 2352-538X
UR  - https://doi.org/10.2991/iwmecs-18.2018.86
DO  - https://doi.org/10.2991/iwmecs-18.2018.86
ID  - Si2018/04
ER  -