Proceedings of the 2017 2nd International Conference on Machinery, Electronics and Control Simulation (MECS 2017)

Dynamic Test Case Prioritization for Functional Testing

Authors
Yue Wu, Chunhai Zhang
Corresponding Author
Yue Wu
Available Online June 2016.
DOI
10.2991/mecs-17.2017.92How to use a DOI?
Keywords
functionnal test, prioritization, dynamic adjustment.
Abstract

In order to improve the efficiency of the functional test, the dynamic test tase prioritizing algorithm is designed, which is used to optimize the execution sequence of the test cases. In this algorithm, 4 factors which are related to the software function are used to calculate the priority of the use case, and The highest priority algorithm instead of the traditional test case sorting algorithm was designed to get the current time has the highest priority test cases rather than all the test cases to sort, and to shorten the test time. In the execution of the use case, the remaining functional coverage is used to achieve dynamic adjustment of the priority which can gradually optimize the execution order of the test case. Finally, it is applied to the actual project testing work, and the results show that the algorithm can improve the functional test efficiency.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2017 2nd International Conference on Machinery, Electronics and Control Simulation (MECS 2017)
Series
Advances in Engineering Research
Publication Date
June 2016
ISBN
10.2991/mecs-17.2017.92
ISSN
2352-5401
DOI
10.2991/mecs-17.2017.92How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yue Wu
AU  - Chunhai Zhang
PY  - 2016/06
DA  - 2016/06
TI  - Dynamic Test Case Prioritization for Functional Testing
BT  - Proceedings of the 2017 2nd International Conference on Machinery, Electronics and Control Simulation (MECS 2017)
PB  - Atlantis Press
SN  - 2352-5401
UR  - https://doi.org/10.2991/mecs-17.2017.92
DO  - 10.2991/mecs-17.2017.92
ID  - Wu2016/06
ER  -