The 2015 2nd International Conference on Modelling, Identification and Control (MIC 2015) was held on August 9-10, 2015, Paris, France.
MIC 2015 is sponsored by American Applied Sciences Research Institute, USA, and technical co-sponsored by The Chinese University of Hong Kong, Hong Kong and Huazhong Normal University, China.
Paris is one of those cities on most people's "to visit" list and quite rightly so. It is not really a question of why visit Paris, rather why would you not. The city of love has its own “je ne sais quoi” whether you've been there once, one hundred times or as yet have only seen it in the movies. Either way, Paris has something which other cities don't. And it's not just that Paris has something special, it has a lot of special something and the city knows it. Its inhabitants are proud to be Parisian and whilst they may not say it out loud, they know that they live in one of the most magical cities in the world.
MIC 2015 will be the most comprehensive conference focused on the various aspects of Modelling, Identification and Control. Our conference provides a chance for academic and industry professionals to discuss recent progress in the area of Modelling, Identification and Control.
The goal of this conference is to bring together the researchers from academia and industry as well as practitioners to share ideas, problems and solutions relating to the multifaceted aspects of Modelling, Identification and Control.
After the excellent presentations on August 9 2015, authors from different countries and areas participated warmly in discussions on August 10 2015, for their viewpoints with dividing into several sessions by topics.
Anyway, our sincere thanks to the support from the technology committee for designing the conference web page and also spending countless days in preparing the final conference program in time for printing. Many thanks to Miss Zhang, MIC 2015 secretary for arranging to type a large number of the invitation letters and for establishing the vast MIC 2015 conference address data base. And thanks to other staffs assisting in the various stage of the editorial work, especially the international committees of our conference.
American Applied Sciences Research Institute, USA