Proceedings of the 2025 7th Management Science Informatization and Economic Innovation Development Conference (MSIEID 2025)

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Defect Detection of Printed Circuit Board Based on Improved YOLOv11

Authors
Jianqiu Sun1, Haoxiang Dai1, Ziheng Yang1, *, Nan Zhao1
1School of Electronic Engineering, Heilongjiang University, Harbin, 150080, China
*Corresponding author. Email: yzh@hlju.edu.cn
Corresponding Author
Ziheng Yang
Available Online 15 February 2026.
DOI
10.2991/978-94-6463-996-4_19How to use a DOI?
Keywords
YOLOv11; Object Detection; PCB
Abstract

This paper proposes a printed circuit board (PCB) defect detection method based on YOLOv11, aiming to improve the defect detection efficiency of PCB and reduce labor costs. By optimizing the YOLOv11 algorithm, the MSCA Attention module is introduced in the attention mechanism, the CARAFE content-aware feature reassembly module is integrated into the feature pyramid network, and a target detection head based on RFAConv is added. Experimental results show that on the public Yinsha PCB dataset, the proposed improved model significantly enhances the accuracy and stability of detection results, with mAP(0.5) increased by 1.9% and mAP(0.5:0.95) improved by 4.1%.

Copyright
© 2026 The Author(s)
Open Access
Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 4.0 International License (http://creativecommons.org/licenses/by-nc/4.0/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.

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Volume Title
Proceedings of the 2025 7th Management Science Informatization and Economic Innovation Development Conference (MSIEID 2025)
Series
Advances in Economics, Business and Management Research
Publication Date
15 February 2026
ISBN
978-94-6463-996-4
ISSN
2352-5428
DOI
10.2991/978-94-6463-996-4_19How to use a DOI?
Copyright
© 2026 The Author(s)
Open Access
Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 4.0 International License (http://creativecommons.org/licenses/by-nc/4.0/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.

Cite this article

risenwbib
TY  - CONF
AU  - Jianqiu Sun
AU  - Haoxiang Dai
AU  - Ziheng Yang
AU  - Nan Zhao
PY  - 2026
DA  - 2026/02/15
TI  - Defect Detection of Printed Circuit Board Based on Improved YOLOv11
BT  - Proceedings of the 2025 7th Management Science Informatization and Economic Innovation Development Conference (MSIEID 2025)
PB  - Atlantis Press
SP  - 217
EP  - 228
SN  - 2352-5428
UR  - https://doi.org/10.2991/978-94-6463-996-4_19
DO  - 10.2991/978-94-6463-996-4_19
ID  - Sun2026
ER  -