The International Technology Management Review

Volume 5, Issue 3, August 2015, Pages 117 - 124

Impact of Technostress on Job Satisfaction: An Empirical Study among Indian Academician

Authors
R.K. Jena
Corresponding Author
R.K. Jena
Available Online 31 August 2015.
DOI
10.2991/itmr.2015.5.3.1How to use a DOI?
Keywords
Job satisfaction, Technostress, Indian Academician, Technostress creators.
Abstract

The contemporary world is becoming very stressful due to the fast changing Information and Communication Technology (ICT). Academic Institutions are also heavily depending on technology for teaching, learning and research. Therefore the pressures of ICT use in academics create technostress among academicians. Technostress can reduce employee satisfaction and create dissonance in the work environment. This study emphasized the impact of technostress on Job satisfaction among academicians in India. The study used Structural Equation Modeling (SEM) method to find the relationship between technostress creators and Job satisfaction. The findings showed a negative impact of technostress creators on job satisfaction.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Journal
The International Technology Management Review
Volume-Issue
5 - 3
Pages
117 - 124
Publication Date
2015/08/31
ISSN (Online)
1835-5269
ISSN (Print)
2213-7149
DOI
10.2991/itmr.2015.5.3.1How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - JOUR
AU  - R.K. Jena
PY  - 2015
DA  - 2015/08/31
TI  - Impact of Technostress on Job Satisfaction: An Empirical Study among Indian Academician
JO  - The International Technology Management Review
SP  - 117
EP  - 124
VL  - 5
IS  - 3
SN  - 1835-5269
UR  - https://doi.org/10.2991/itmr.2015.5.3.1
DO  - 10.2991/itmr.2015.5.3.1
ID  - Jena2015
ER  -