Proceedings of the 2017 International Conference Advanced Engineering and Technology Research (AETR 2017)

Micro Resistance Tester Based on AC Constant Current Excitation

Authors
Qian Zhang, Miao Shen, Zhongru Shen
Corresponding Author
Qian Zhang
Available Online March 2018.
DOI
10.2991/aetr-17.2018.74How to use a DOI?
Keywords
Micro-resistance measurement; Sine constant current excitation source; Phase-locked amplification
Abstract

The traditional four-probe method to extract the response signal of the micro-resistance under test can improve the accuracy of the lead resistance and the contact resistance on the measurement result, but not effectively eliminate the internal noise of the operational amplifier and the external electromagnetic interference. In this paper, a sinusoidal constant current source excited by a fixed frequency is used to inject a response signal from a low-noise, high-impedance operational amplifier. After the phase-locked amplification and filter circuits are combined to form an adjustment circuit, the fixed frequency signal is shaped and dynamically phase-shifted , Into the lock-in amplifier as a reference signal. The developed prototype (0-1?) and a dedicated impedance tester were tested, the test results show that the prototype work is stable, with higher measurement accuracy.

Copyright
© 2018, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2017 International Conference Advanced Engineering and Technology Research (AETR 2017)
Series
Advances in Engineering Research
Publication Date
March 2018
ISBN
10.2991/aetr-17.2018.74
ISSN
2352-5401
DOI
10.2991/aetr-17.2018.74How to use a DOI?
Copyright
© 2018, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Qian Zhang
AU  - Miao Shen
AU  - Zhongru Shen
PY  - 2018/03
DA  - 2018/03
TI  - Micro Resistance Tester Based on AC Constant Current Excitation
BT  - Proceedings of the 2017 International Conference Advanced Engineering and Technology Research (AETR 2017)
PB  - Atlantis Press
SP  - 387
EP  - 392
SN  - 2352-5401
UR  - https://doi.org/10.2991/aetr-17.2018.74
DO  - 10.2991/aetr-17.2018.74
ID  - Zhang2018/03
ER  -