Proceedings of the 2015 International Conference on Artificial Intelligence and Industrial Engineering

Molecular Dynamics Study of Nanoimprint of Single Crystal Aluminium Thin Film

Authors
Y. Yuan, T. Sun, J.J. Zhang, C. Liu
Corresponding Author
Y. Yuan
Available Online July 2015.
DOI
10.2991/aiie-15.2015.129How to use a DOI?
Keywords
nanoimprint; molecular dynamics; single crystal aluminium; thin film, stamp
Abstract

In current study, molecular dynamics simulations are performed to investigate nanoimprint processes on single crystal aluminium thin films with silicon stamp. An EAM potential developed for aluminium is adopted to describe the Al-Al interaction in the aluminium thin film, and the Lennard-Jones potential is used to describe the Al-Si atomic interaction. Simulations show that dislocation events are the main plastic deformation mode of Al thin film in nanoimprint. It is found that stamp size and stamp shape have significant influence on the dislocation events and imprint forces during the nanoimprint processes.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Artificial Intelligence and Industrial Engineering
Series
Advances in Intelligent Systems Research
Publication Date
July 2015
ISBN
10.2991/aiie-15.2015.129
ISSN
1951-6851
DOI
10.2991/aiie-15.2015.129How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Y. Yuan
AU  - T. Sun
AU  - J.J. Zhang
AU  - C. Liu
PY  - 2015/07
DA  - 2015/07
TI  - Molecular Dynamics Study of Nanoimprint of Single Crystal Aluminium Thin Film
BT  - Proceedings of the 2015 International Conference on Artificial Intelligence and Industrial Engineering
PB  - Atlantis Press
SP  - 476
EP  - 479
SN  - 1951-6851
UR  - https://doi.org/10.2991/aiie-15.2015.129
DO  - 10.2991/aiie-15.2015.129
ID  - Yuan2015/07
ER  -